Silicon nitride
Conventional transmission electron brightfield image
A conventional atomic resolution brightfield image created
by imaging a sample of Silicon Nitride (Si3N4) with a transmission electron microscope.
Phase image computed with QPt™ for DigitalMicrograph™
By using the QPI algorithm an atomic resolution phase image
can be created. Back propagating this phase image to the sample
exit surface yields the view seen in the upper half of this image. The phase corresponding to
the minimum amplitude variation is shown in the lower half, where some of the Silicon
(red) and Nitrogen (green) atoms have been indicated.
3D rendered view of one hexagonal unit
A 3D rendering of a section of the minimum amplitude phase image
produced with Research Systems IDL software.
Brightfield & phase images courtesy K. Ishizuka, HREM Research Inc., Japan.
For more information about this sample please see the HREM Research Inc. EMC 2004 poster available here.